ISSN 2380-4505
Vol. 2008, Issue Symposium, 2008July 28, 2026 EDT
Accelerated Degradation Test under Multiple Environmental Stresses and Reliability Estimation for Circular Electrical Connectors
Accelerated Degradation Test under Multiple Environmental Stresses and Reliability Estimation for Circular Electrical Connectors
Sun, Bo, S K Zeng, Rui Kang, S N Zhang, and M S Lu. 2026. “Accelerated Degradation Test under Multiple Environmental Stresses and Reliability Estimation for Circular Electrical Connectors.” IMAPSource Proceedings 2008 (Symposium): 936–41. https://doi.org/10.4071/001c.165904.