Board Level Reliability Testing of High-Rel Microprocessors Associated to ROHS Packaging Solutions

Olivier Gaillard; Benoît Dervaux

doi:10.4071/001c.165733

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Gaillard, Olivier, and Benoît Dervaux. 2026. “Board Level Reliability Testing of High-Rel Microprocessors Associated to ROHS Packaging Solutions.” IMAPSource Proceedings 2008 (Symposium): 737–44. https://doi.org/10.4071/001c.165733.

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