Reliability of Embedded Large-Area High-K Dielectric Capacitors in LTCC Substrates

M. Ray Fairchild; K.M. Nair; M. McCombs; Michael A. Skurski; Phillip S. Fisher

doi:10.4071/001c.163833

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Fairchild, M. Ray, K.M. Nair, M. McCombs, Michael A. Skurski, and Phillip S. Fisher. 2026. “Reliability of Embedded Large-Area High-K Dielectric Capacitors in LTCC Substrates.” IMAPSource Proceedings 2008 (Symposium): 019–025. https://doi.org/10.4071/001c.163833.

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