Optimization of Probing Needle Design for Wafer-level Probing Test

Meng-Kai Shih; Yi-Shao Lai

doi:10.4071/001c.165476

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Shih, Meng-Kai, and Yi-Shao Lai. 2026. “Optimization of Probing Needle Design for Wafer-Level Probing Test.” IMAPSource Proceedings 2008 (Symposium): 701–5. https://doi.org/10.4071/001c.165476.

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