ISSN 2380-4505
Vol. 2008, Issue Symposium, 2008June 26, 2026 EDT
Drop Impact Dynamic Response Study of JEDEC JESD22-B111 Test Board
Drop Impact Dynamic Response Study of JEDEC JESD22-B111 Test Board
Krist, Michael, Jianbiao Pan, Andrew Farris, and Nicolas Vickers. 2026. “Drop Impact Dynamic Response Study of JEDEC JESD22-B111 Test Board.” IMAPSource Proceedings 2008 (Symposium): 123–29. https://doi.org/10.4071/001c.164096.
