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ISSN 2380-4505
Symposium Proceedings
Vol. 2008, Issue Symposium, 2008June 26, 2026 EDT

Drop Impact Dynamic Response Study of JEDEC JESD22-B111 Test Board

Michael Krist, Jianbiao Pan, Andrew Farris, Nicolas Vickers,
Drop testaccelerationdynamic responsereliabilitylead free solder
https://doi.org/10.4071/001c.164096
IMAPSource Conference Papers
Krist, Michael, Jianbiao Pan, Andrew Farris, and Nicolas Vickers. 2026. “Drop Impact Dynamic Response Study of JEDEC JESD22-B111 Test Board.” IMAPSource Proceedings 2008 (Symposium): 123–29. https://doi.org/10.4071/001c.164096.
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