ISSN 2380-4505
Vol. 2008, Issue Symposium, 2008July 14, 2026 EDT
Response Surface Analysis and its Use to Predict LTCC Firing Shrinkage for RF Microelectronics
Response Surface Analysis and its Use to Predict LTCC Firing Shrinkage for RF Microelectronics
Girardi, Michael, Gregg Barner, Cristie Lopez, Brent Duncan, and Larry Zawicki. 2026. “Response Surface Analysis and Its Use to Predict LTCC Firing Shrinkage for RF Microelectronics.” IMAPSource Proceedings 2008 (Symposium): 330–35. https://doi.org/10.4071/001c.165068.