Relationship of Cu Oxidation and Hardness towards Cratering in Wirebonding

Lee Chai Ying; Lee Cher Chia; Lim Chee Chian

doi:10.4071/001c.165135

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Ying, Lee Chai, Lee Cher Chia, and Lim Chee Chian. 2026. “Relationship of Cu Oxidation and Hardness towards Cratering in Wirebonding.” IMAPSource Proceedings 2008 (Symposium): 397–404. https://doi.org/10.4071/001c.165135.

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