Novel ESD Protection Scheme for Testing High Voltage LDMOS

Sukeshwar Kannan; Bruce Kim; Friedrich Taenzler; Richard Antley; Ken Moushegian

doi:10.4071/isom-2012-WA52

Kannan, Sukeshwar, Bruce Kim, Friedrich Taenzler, Richard Antley, and Ken Moushegian. 2012. “Novel ESD Protection Scheme for Testing High Voltage LDMOS.” IMAPSource Proceedings 2012 (1): 683–86. https://doi.org/10.4071/isom-2012-WA52.

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