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Symposium Proceedings
Vol. 2012, Issue 1, 2012January 01, 2012 EDT

Understanding and Controlling Cu Protrusions in 3D TSV Processing

Seth Kruger, Klaus Hummler, Robert Geer, Kathleen Dunn, Colin McDonough, Aaron Cordes, Jack Enloe, Brian Sapp, Iqbal Ali, Stefan Pieper, Sitaram Arkalgud, Thomas Murray,
Cu protrusions3DTSVCu-filledthrough-silicon vias2.5 integrated chipCTE
https://doi.org/10.4071/isom-2012-TA15
IMAPSource Conference Papers
Kruger, Seth, Klaus Hummler, Robert Geer, Kathleen Dunn, Colin McDonough, Aaron Cordes, Jack Enloe, et al. 2012. “Understanding and Controlling Cu Protrusions in 3D TSV Processing.” IMAPSource Proceedings 2012 (1): 23–30. https:/​/​doi.org/​10.4071/​isom-2012-TA15.
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