Vol. 2022, Issue IMAPS Symposium, 2022May 01, 2023 EDT
Electromigration Risk Assessment and Circuit Optimization using Innovative Multiphysics Modeling
Electromigration Risk Assessment and Circuit Optimization using Innovative Multiphysics Modeling
Cai, Chongyang, Zhi Yang, Yuan Li, Padam Jain, Terry Kang, and Krishna Mellachervu. 2023. “Electromigration Risk Assessment and Circuit Optimization Using Innovative Multiphysics Modeling.” IMAPSource Proceedings 2022 (IMAPS Symposium): 000155–61. https://doi.org/10.4071/001c.74637.