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ISSN 2380-4505
High Temperature Conference Papers
Vol. 2010, Issue HITEC, 2010January 01, 2010 EDT

A High-Temperature Folded-Cascode Operational Transconductance Amplifier in 0.8-μm BCD-on-SOI

C. Su, B. J. Blalock, S. K. Islam, L. Zuo, L. M. Tolbert,
high temperature electronicsoperational transconductance amplifierinversion coefficienttemperature stable current reference
https://doi.org/10.4071/HITEC-CSu-TA26

Articles in Vol. 2010, Issue HITEC, 2010

Vol. 2010, Issue HITEC, 2010
  • Piezoelectric Structural Sensor Technology for Extreme Environments
    Michael Ian LapsleyEdward F. AlbertaRaffi SahulWesley HackenbergerXiaoning JiangShujun ZhangThomas Shrout
  • Rugged ICs against Corrosion, Shock plus Hotter Temperatures
    James J. Wang
  • The Behaviour of Au-Au Wire Bonds in Extreme Environments
    D. ShepherdP.S. GrantC. JohnstonS. Riches
  • Packaging Technology for High Temperature Capacitive Pressure Sensors
    Liang-Yu ChenGlenn M. BeheimRoger D. Meredith
  • New High Temperature Electronic Components for Power Management and Motor Control Applications
    Pierre DelatteV. DessardA. SaibN. PequignotG. PicúnL. DemeûsL. MartinezT. KrebsJ.-C. Doucet
  • Modeling and Simulation of the Thermal Drift Characteristics of the Piezoresistive Pressure Sensor
    R. OtmaniN. BenmoussaK. Ghaffour
  • High Temperature Lithium Alloy Cells With Improved Low Temperature Performance
    Arden P. JohnsonCuiyang WangJohn S. Miller
  • Assessing the Reliability of Die Attach Materials in Electronic Packages for High Temperature Applications
    M.F. SousaS. RichesC. JohnstonP.S. Grant
  • High-Temperature, Bulk-CMOS Integrated Circuits for a Distributed FADEC System
    Steve MajerusDaniel HoweSteven GarverickDavid HiscockWalter Merrill
  • SiC Power Switch Module
    Michael J. PalmerR. Wayne JohnsonTracy AutryRizal AguirreVictor LeeJames D. Scofield
  • High Temperature (230 °C) Isolated Power Supply
    B. ReeseR. ShawJ. HornbergerR. SchupbachA. Lostetter
  • Edge-Controlled Mechanical Failure of Si and SiC Semiconductor Chips
    A. A. WereszczakO. M. JadaanT. P. Kirkland
  • 285°C Resistor Drift and Failure Analysis
    Mark HahnRon SmithMilton Watts
  • Demonstrated Performance Characteristics For Improved High Temperature Ceramic Capacitors Intended For Use In Extreme, Harsh Environments
    Mustafa A. SyammachMichael J. RoachFauzi A. SyammachMustapha Habibi
  • Performance and Reliability Characteristics of 1200 V, 100 A, 200°C Half-Bridge SiC MOSFET-JBS Diode Power Modules
    James D. ScofieldJ. Neil MerrettJames RichmondAnant AgarwalScott Leslie
  • High Temperature Inverter for Airborne Application
    Fabien DuboisDominique BergogneDamien RisalettoRémi RobutelHervé MorelRégis MeuretSonia Dhokkar
  • High Temperature Capacitors Based on [0001] and [1120] Sapphire Dielectrics
    Liang-Yu Chen
  • New Rechargeable Battery for Application in a Wide Temperature Range
    Josip CajaT. Don DunstanMario Caja
  • High Temperature Performance of Normally-off SiC JFET's Compared to Competing Approaches
    J.B. CasadyD.C. SheridanA. RitenourV. BondarenkoR. Kelley
  • High Temperature (250 °C) Silicon Carbide Power Modules With Integrated Gate Drive Boards
    B. ReeseB. McPhersonR. ShawJ. HornbergerR. SchupbachA. LostetterB. RowdenA. MantoothS. AngJ. BaldaK. OkumuraT. Otsuka
  • High temperature solders containing Aluminum and Zinc
    H.R. KotadiaO. MokhtariM. BottrillM. P. ClodeM. A. GreenS. H. Mannan
  • Capacitor Characterization Study for a High Power, High Frequency Converter Application
    William C. LanterHiroyuki KosaiTyler BixelB. Allen TolsonJeffery StrickerJames ScofieldNavjot BrarBiswajit Ray
  • 1200 V 6 A High Temperature SiC BJTs
    Anders LindgrenMartin Domeij
  • High-Temperature, High-Dielectric-Constant Capacitors for Power Inverters in Hybrid Electric Vehicles
    U. BalachandranM. NarayananB. Ma
  • Parylene HT®: A High Temperature Vapor Phase Polymer for Electronics Applications
    Rakesh Kumar
  • HIGH TEMPERATURE ULTRA HIGH VOLTAGE SIC THYRISTORS
    R. SinghS. CreamerE. LieserS. JeliazkovS. Sundaresan
  • Comparison of High Temperature Operation of Silicon Carbide MOSFETs and Bipolar Junction Transistors
    Jim RichmondSei-Hyung RyuQingchun (Jon) ZhangBrett HullMrinal DasAlbert BurkAnant AgarwalJohn Palmour
  • Nanocomposite Film Dielectrics for High Temperature Power Conditioning Capacitors
    Kirk SlenesLew Bragg
  • Thermomechanical Stresses in Copper Films at Elevated Temperature
    Martin LedererJavad ZarbakhshRui HuangThomas DetzelBrigitte Weiss
  • Swelling Phenomena in Sintered Silver Die Attach Structures at High Temperatures: Reliability Problems and Solutions for an Operation above 350°C
    N. HeuckS. MüllerG. PalmA. BakinA. Waag
  • Robust Class-I BME Ceramic Capacitors for High Temperature Applications
    Abhijit GuravXilin XuJim MageeJeff FranklinTravis Ashburn
  • Compact modeling of the high temperature effect on the single event transient current generated by heavy ions in SOI 6T-SRAM
    E. BoufoussJ. AlvaradoD. Flandre
  • A Universal BCD-on-SOI Based High Temperature Short Circuit Protection for SiC Power Switches
    Liang ZuoS. K. IslamM. A. HuqueC. SuB. J. BlalockL. M. Tolbert
  • Characterization of Thick Film Technology for 300°C Packaging
    Rui ZhangR. Wayne JohnsonVinayak TilakTan ZhangDavid Shaddock
  • Effect of High Temperature Ageing on Active and Passive Power Devices
    Cyril ButtayRemi RobutelChristian MartinChristophe RaynaudSimeon DampieniDominique BergogneThibaut Chailloux
  • Development of a SiC SSPC Module with Advanced High Temperature Packaging
    Douglas C HopkinsYuan-Bo GuoHerbert E DwyerJames D. Scofield
  • Development of a 300°C capable SiC based operational amplifier
    Vinayak TilakCheng-Po ChenPeter LoseeEmad AndarawisZachary Stum
  • Application of High Temperature Electronics Packaging Technology to Signal Conditioning and Processing Circuits
    S T RichesK CannonC JohnstonM SousaP GrantJ GulliverM LangleyR PittsonS SerbanD BaghurstM Firmstone
  • A High-Temperature Folded-Cascode Operational Transconductance Amplifier in 0.8-μm BCD-on-SOI
    C. SuB. J. BlalockS. K. IslamL. ZuoL. M. Tolbert
  • SiGe Amplifier and Buffer Circuits for High Temperature Applications
    Dylan B. ThomasNelson E. LourencoJohn D. CresslerSteven Finn
  • Practical Oil Field Requirements for New High-Temperature Batteries
    Randy Normann
  • High Temperature CMOS Reliability and Drift
    Shane Rose
  • The Development and Qualification of a DC-DC Converter for 225°C (437°F) Operating Temperature
    Bob Hunt
  • Design of High Temperature EMI Input Filter for a 2 kW HVDC-fed Inverter
    Remi RobutelChristian MartinHerve MorelCyril ButtayDominique BergogneNicolas Gazel
  • High Temperature SiC Power Module Electrical Evaluation Procedure
    Puqi NingFred WangKhai D. T. Ngo
  • Performance and Reliability of MEMS Gyroscopes and Packaging at High Temperatures
    Patrick McCluskeyChandradip PatelDavid Lemus
  • A Comparison of Multilayer Ceramic Capacitor Technologies for High Temperature Applications
    Craig NiesScott HarrisStanley Cygan
  • Assessment of Au-Ge Die Attachment for an Extended Junction Temperature Range in Power Applications
    Satoshi TanimotoKohei MatsuiYoshinori MurakamiHiroshi YamaguchiHajime Okumura
  • Reliability Assessment of Passives for 300C using HALT
    David ShaddockVinayak TilakTan ZhangRui ZhangR. Wayne Johnson
  • Modeling and Design of High Temperature Silicon Carbide DMOSFET Based Medium Power DC-DC Converter
    Siddharth PotbhareAkin AkturkNeil GoldsmanJames M. McGarrityAnant Agarwal
  • Metallurgy for SiC Die Attach for Operation at 500°C
    Ping ZhengPhillip HensonR. Wayne JohnsonLiangyu Chen
  • Performance of commercial SOI driver in harsh conditions (up to 200°C)
    K. El FalahiB. AllardD. TournierD. Bergogne
  • “Migration of Sintered Nanosilver Die-attach Material on Alumina Substrate at High Temperatures”
    Yunhui MeiDimeji IbitayoXu ChenSusan LuoGuo-Quan Lu
IMAPSource Conference Papers
Su, C., B. J. Blalock, S. K. Islam, L. Zuo, and L. M. Tolbert. 2010. “A High-Temperature Folded-Cascode Operational Transconductance Amplifier in 0.8-Μm BCD-on-SOI.” IMAPSource Proceedings 2010 (HITEC): 83–88. https://doi.org/10.4071/HITEC-CSu-TA26.
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