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Device Packaging Conference Presentations
Vol. 2024, Issue DPC, 2024January 23, 2025 EDT

Improved Yield Estimation for Heterogeneously Integrated Components

Andrew Ferris, Matthew Jordan,
yield estimationheterogeneously integrated componentscontinuous monitoringIn Situ monitoring
https://doi.org/10.4071/001c.129009
IMAPSource Conference Papers
Ferris, Andrew, and Matthew Jordan. 2025. “Improved Yield Estimation for Heterogeneously Integrated Components.” IMAPSource Proceedings 2024 (DPC): 678–99. https:/​/​doi.org/​10.4071/​001c.129009.
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