Vol. 2024, Issue DPC, 2024January 28, 2025 EDT
Applications of White Light Interferometry in Advanced Packaging: Metrology and Quality Assurance
Applications of White Light Interferometry in Advanced Packaging: Metrology and Quality Assurance
Chintala, Ravi, Daphne Mariaravi, and Samuel Lesko. 2025. “Applications of White Light Interferometry in Advanced Packaging: Metrology and Quality Assurance.” IMAPSource Proceedings 2024 (DPC): 1165–92. https://doi.org/10.4071/001c.129115.