This website uses cookies

We use cookies to enhance your experience and support COUNTER Metrics for transparent reporting of readership statistics. Cookie data is not sold to third parties or used for marketing purposes.

Skip to main content
null
IMAPSource Conference Papers
  • Menu
  • Articles
    • Ceramics Conference Papers
    • Device Packaging Conference Presentations
    • EMPC Conference Proceedings (IMAPS Europe)
    • General
    • High Temperature Conference Papers
    • IMAPS Chapter Conferences
    • Symposium Proceedings
    • Technical Articles
    • All
  • For Authors
  • Editorial Board
  • About
  • Issues
  • Journal Micro & Elect Pkg
  • search
  • LinkedIn (opens in a new tab)
  • RSS feed (opens a modal with a link to feed)

RSS Feed

Enter the URL below into your favorite RSS reader.

http://localhost:38963/feed
ISSN 2380-4505
Device Packaging Conference Presentations
Vol. 2016, Issue DPC, 2016January 01, 2016 EDT

Innovated L/S less than 2/2μm Line Embedded 2.1D Organic Substrate Technology

Yu-Hua Chen,
Line Embedded2.1D Organic Substratephoto-sensitive dielectric
https://doi.org/10.4071/2016DPC-WP42

Articles in Vol. 2016, Issue DPC, 2016

Vol. 2016, Issue DPC, 2016
  • Current status and future prospects of panel level packaging
    Santosh KumarAmandine PizzagalliDave TowneThibault BuissonAndrej IvankovicRozalia Beica
  • Emerging Flux Challenges for BGA Packages
    Maria DurhamAndy MackieJason Chou
  • Laser-based Package Singulation and Trenching for SiP
    Dirk MuellerDavid ClarkJoris VanNunenEd ReaHatim Haloui
  • Packaging and Assembly Challenges for 2.5D/3D Devices
    Gerald BeyerKenneth RebibisArnita PodpodFrancisco CadacioTeng WangAndy MillerEric Beyne
  • Investigation of Warpage Behavior of Silicon Semiconductor on a Silicon - Adhesive - Ceramic Integrated Structure at Cryogenic Temperatures--STUDENT BEST PAPER $1500
    Eyup Can BalogluTuba Okutucu OzyurtZafer Dursunkaya
  • Embedded RDL Enabled by Excimer Laser Ablation
    Habib Hichri
  • Characterization of Clean after Photoresist Removal from Wafers with Copper Pillars with Lead-Free Solder Caps
    Kimberly PollardRichie PetersMichael PhenisDon Pfettscher
  • First Integration Steps of Cu-based DNA Nanowires for interconnections
    Christophe BrunCorentin CarmignaniCheikh Tidiane-DiagneSimona TorrengoPierre-Henri ElchingerPatrick ReynaudAurélie ThuaireSeverine CheramyDidier GasparuttoRaluca TironArianna FiloramoXavier Baillin
  • SiP Technology Trends
    Hamid Eslampour
  • Numerical Simulation of Copper Migration in Single Crystal CdTe
    Da GuoDragica Vasileska
  • Preserving Nb Superconducvity in Thin Film Flexible Structures
    Vaibhav GuptaJohn A. SellersCharles D. EllisSimin ZouGeorge A. HernandezRujun BaiYang CaoDavid B. TuckermanMichael C. Hamilton
  • Innovated Process Integration for Panel Size Glass Substrate Manufacturing for SiP Application
    Yu-Hua ChenYu-Chung HsiehWei-Di LinChun-Hsien ChienDyi-Chung Hu
  • Precise, high throughput dispensing of thermal interface material in BGA packaging applications
    Hanzhuang LiangLinh Rolland
  • Low profile Flip-Type or Embedded Silicon Capacitors for decoupling
    Catherine BunelFranck Murray
  • M-Series with Adaptive Patterning for High-Yield Fan-Out SIP
    Craig BishopSuresh JayaramanBoyd RogersChris ScanlanTim Olson
  • An Innovative Package EMC Solution Using a Highly Cost-Effective Sputtered Conformal Shield
    Nozad KarimRong ZhouJun Fan
  • Nonlinear Dynamics and Chaos in Micro/Nano-Scale Systems and Applications
    Ying-Cheng Lai
  • A study on warpage behavior of EMC in post-mold cure stage using Moldex3D
    Hsu Chih-ChungSrikar VallurySrikar ValluryKai LinAnthony Yang
  • Impact of Top Die Thickness on Cu Pillar Fatigue in Exposed Die 3D Packages
    Rahul AgarwalSukesh KannanShan GaoRick ReedYong SongJS Paek
  • Enhancements of an In Situ Atmospheric System for Real Time Weather Monitoring
    Mark L. AdamsAudrey Rose ShaplandMatthew GutierrezHaley HarrellJessica BlumeCraig Prather
  • System level IC packaging - Integration of Key Technologies: TSVs, Interposers, and Advanced IC Packaging
    Mike KellyDave HinerMarnie MatteiRick ReedPaul SilvestriRon Huemoeller
  • 2.5D / 3D IC Landscape: Market and Technology Trends
    Andrej IvankovicThibault BuissonAmandine PizzagalliDave TowneRozalia Beica
  • Improvements in Decision Making Criteria for Thermal Warpage
    Neil Hubble
  • Advances in Aligned Wafer Bonding Enable by High Vacuum Processing
    Eric F. PaboChristoph FloetgenBernhard RebhanRazek Nasser
  • A Novel Third Order Analog Chaotic Oscillator
    Benjamin K. RheaFrank T. WernerRemington C. HarrisonRobert N. Dean
  • Thin WLFO and based WLSiP enabling WL3D, realized using Temporary Reconstituted Panel Bonding Technology
    Steffen KroehnertJose CamposAndré CardosoMariana PiresEoin O'TooleRaquel PintoEmilie JolivetThomas UhrmannElizabeth BrandlJürgen BurggrafHarald WiesbauerJulian BravinMarkus WimplingerPaul Lindner
  • TCB Process Options to Achieve the Lowest Cost
    Tom Strothmann
  • Nonlinear Observability Analysis of Micro-machined Electrostatic Actuators Using Self-Sensing
    Chong LiRobert N. DeanGeorge T. Flowers
  • Terahertz Diode Arrays and Differential Probes based on Heterogeneous Integration and Silicon Micromachining
    Robert M. WeikleC. ZhangS. HawasliS. NadriL. XieN. Scott BarkerA.W. Lichtenberger
  • Design of high density SiP for complex computing system in micro SD format
    Chris Baratt
  • The Direct plating copper (DPC) ceramic material on Al2O3/AlN or LTCC (Low-temperature co-fired ceramic) substrates
    Ho-Chieh (Jay) YuJason Huang
  • How Mitigation Techniques Affect Reliability Results for BGAs
    Greg CaswellMelissa Keener
  • A MEMS PPA Based Active Vibration Isolator - STUDENT AWARD 3RD PLACE $500
    Chong LiC. Lavinia ElanaRobert N. DeanGeorge T. Flowers
  • Evaluation of High-Speed Copper Plating Products for RDL, Micropillar, and Fan-Out Applications
    Matthew A ThorsethMark ScalisiInho LeeSang-Min ParkYil-Hak LeeJonathan PrangeMasaaki ImanariMark LefebvreJeff Calvert
  • Testing in-package DRAMs and DFX features in 3D high-bandwidth memory
    Chris Nelson
  • A Multiscale Modeling Approach to Study Transport in Silicon Heterojunction Solar Cells
    Pradyumna MuralidharanStuart BowdenStephen M. GoodnickDragica Vasileska
  • High Speed Electroplating of 200um High Cu Bumps for Die Stacking Architectures
    Richard Hollman
  • Laser Direct Patterning of Dry Etch BCB Adhesive Layers for Low Temperature Permanent Wafer-to-Wafer Bonding
    Kai ZoschkeJ.-U. KimM. WegnerM. GallagherR. BarrJ. CalvertM. ToepperK.-D. Lang
  • Si Photonics Deployment Using Cu Pillar Interconnect and Chip On Wafer Platform
    Miguel Jimarez
  • Embedded Die Packages and Modules for Power Electronics Applications
    Lars BoettcherS. KaraszkiewiczD. ManessisA. Ostmann
  • Process and Evaluation of High Reliability Reworkable Edge Bond Adhesives for Large Area BGA Applications
    Swapan BhattacharyaFei XieDaniel F. BaldwinHan WuKelley HodgeQing Ji
  • Photolithography Alignment Mark Transfer System for Low Cost, Advanced Packaging, and Bonded Wafer Applications
    Tom SwarbrickKeith BestCasey DonaherSteve Gardner
  • A Matched Filter Developed for Chaotic Waveforms
    Frank T. WernerBenjamin K. RheaAubrey N. BealWilliam E. AbellJohn P. BaileyRemington C. HarrisonRobert N. DeanMichael C. Hamilton
  • Advancements in Glass for Packaging Applications
    Kevin AdrianceGene SmithAric ShoreyRachel LuGene Smith
  • Non-Conductive Film (NCF) Underfill: Materials, Performance, and Evolution to Next Generation Devices
    Edgardo AnzuresPaul MorganelliPaul MorganelliRobert BarrJeffrey CalvertAvin DhobleDavid FlemingJong-Uk KimHerong LeiJürgen GrafeJulian Haberland
  • Washable Coatings for Packaging Practices
    John MooreAlex Brewer
  • Advancements in Flip Chip Assembly Equipment and Processes
    Bob ChylakHorst ClaubergDaniel Buergi
  • Why Mold When You Can NanoTech?
    Simon McElrea
  • Innovated L/S less than 2/2μm Line Embedded 2.1D Organic Substrate Technology
    Yu-Hua Chen
  • Design of TSV-based Inductors for Internet of Things
    Bruce C KimSaikat Mondal
  • Critical Process Parameters And Failure Analysis For Temporary Bonded Wafer Stacks
    Elisabeth BrandlKarine AbadieMarkus WimplingerJuergen BurggrafThomas UhrmannJulian BravinFrank FournelPierre Montmeat
  • Comparison of hermetic sealing using SAC and SnPb solder for a MEMS pressure sensor
    Maaike M. Visser TakloBranson BelleJoachim Seland GraffAstrid-Sofie VardøyElisabeth Ramsdal
  • Extending WLCSP Packaging Technology Capabilities to Enable Miniaturized Sensor and MEMS Packaging Applications
    Ted Tessier
  • Cost Breakdown of 2.5D and 3D Packaging
    Chet PaleskoAmy Palesko
  • Ultra Fine Pitch RDL Development in Multi-layer eWLB (embedded Wafer Level BGA) Packages
    Bernard AdamsWon Kyung ChoiDuk Ju NaAndy YongSeung Wook YoonJaesik LeeUrmi RayRiko Radojcic
  • A Survey of Nonlinear Phenomena and Chaos in Microsystems and Packaging
    Aubrey N. BealRobert N. Dean
  • Impact of electrical and thermal stresses on TSV radiofrequency performance
    Anh Phuong NGUYENUlrike LüdersFrederic Voiron
  • Wafer-level packaging for ultra-thin glasses using hermetic room temperature welding technology
    Heidi LundénAntti PeltonenAntti Määttänen
  • Stacking of 3D Capacitor Chips in a Package for a Compact and Reliable Component Working at High Temperature
    Stephan BorelP. DescoursB. GoubaultP. NicolasR. FraniatteG. ParatM. PommierS. YonG. SimonC. Bunel
  • Nonlinear dynamics induced anomalous Hall effect in topological insulators
    Guanglei WangHongya XuYing-Cheng Lai
  • 3D Printing of High Voltage Printed Wiring Boards
    Eric MacDonaldRyan WickerDavid EspalinAndy KwasPeter Ruby Craig Kief
IMAPSource Conference Papers
Chen, Yu-Hua. 2016. “Innovated L/S Less than 2/2μm Line Embedded 2.1D Organic Substrate Technology.” IMAPSource Proceedings 2016 (DPC): 1682–1712. https://doi.org/10.4071/2016DPC-WP42.
Save article as...▾

View more stats

Powered by Scholastica, the modern academic journal management system