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ISSN 2380-4505
High Temperature Conference Papers
Vol. 2019, Issue HiTen, 2019July 01, 2019 EDT

Fully Integrated Sensor Electronics for Inductive Proximity Switches Operating up to 250 °C

Sebastian Braun, Norbert Kordas, Alexander Utz, Holger Kappert, Rainer Kokozinski,
Inductive proximity switchhigh temperature electronicshigh temperature SOI CMOS technology
https://doi.org/10.4071/2380-4491.2019.HiTen.000112

Articles in Vol. 2019, Issue HiTen, 2019

Vol. 2019, Issue HiTen, 2019
  • Modular Desktop Platform for High-Temperature Characterization and Test up to 300 °C
    Tom ReinholdBjörn BieskeGeorg GläserMichael Meister
  • An Advanced Extreme Environment Wireless Telemetry System for Turbine Blade Instrumentation
    John R. FraleyAlan MantoothSajib RoyRobert MurphreeAffan AbassiAnand KulkarniJoshua McConkey
  • High Temperature Memory Design, Implementation, and Characterization in 1μm SiC CMOS Technology
    Affan AbbasiRobert MurphreeSajib RoyMarvin SuggsJohn FraleyH. Alan MantoothJia DiTobias Erlbacher
  • Bonding strength of Cu/Cu joints using sintering process of micro-sized Cu particles for high-temperature application
    Hiroshi NishikawaXiangdong Liu
  • Investigation of phase change materials for efficient thermal management of electronic modules
    A. NovikovJ. MaxaM. NowottnickM. HeimannK. Jarchoff
  • Moisture-resistant sealing materials for downhole HPHT electrical feedthrough package
    Hua XiaNelson SettlesDavid DeWire
  • High Temperature – High Voltage Solid Electrolytic Tantalum Capacitors
    Y. FreemanP. Lessner
  • Stackable SiC Embedded Ceramic Packages for High Voltage and High Temperature Power Electronics Applications
    Hoang Linh BachDaniel DirksenChristoph BlechingerTobias Maximilian EndresChristoph Friedrich BayerAndreas SchletzMartin März
  • Resistors for High Temperature Applications
    Tom Morris
  • Comparative study of how additives affect sintered silver microstructure in die-attach applications
    Ming LoSeyed Amir PaknejadHarry BorrillWan K. KongAddo Addo-KwabenaMohamed SaidouneChris PowleyNaim KapadiaYang ZuoSamjid H. Mannan
  • A modular application specific active test environment for high-temperature wafer test up to 300 °C
    Michael MeisterMarco Reinhard
  • Characteristics of Organic-Based Thermal Interface Materials Suitable for High Temperature Operation
    Baron WangAndrea S. ChenRandy H.Y. Lo
  • Miniature Power Sources for High Temperature Industrial Sensors
    Brian E. HaydenLouise M.V. TurnerRobert NobleLaura PerkinsDenis Pasero
  • Parametric study of electronics components joining using reactive films for high temperature applications
    Rabih KhazakaDonatien MartineauToni YoussefThanh Long LeStéphane Azzopardi
  • Study of Thermal Stress in Nano Silver Bonded Silicon Substrates for High Temperature Applications
    G.D. LiuC.H. Wang
  • Considerations for Sintering in High Temperature Electronics
    Thomas Krebs
  • Fabrication of highly reliable joint based on Cu@Ni@Sn double-layer powder for high temperature application
    Hongyan XuYaochun ShenYihua HuJianqiang LiJu Xu
  • The Impact of AuSn Preforms Thickness on Solder Joint Reliability
    Bernard Leavitt
  • Origami for Tight Spaces - 3D 250C PCB Assemblies for Control Systems
    Piers TremlettPhil ElliotPablo Tena
  • Fully Integrated Sensor Electronics for Inductive Proximity Switches Operating up to 250 °C
    Sebastian BraunNorbert KordasAlexander UtzHolger KappertRainer Kokozinski
  • On-turbine multisensors based on Hybrid Ceramic Manufacturing Technology
    Steffen ZiescheAdrian GoldbergUwe PartschHolger KappertHeidrun KindMirko AdenFalk Naumann
  • Improved sinterability of particles to substrates by surface modifications on substrate metallization
    Sri Krishna BhogarajuOmid MokhtariJacopo PascucciFosca ContiGordon Elger
IMAPSource Conference Papers
Braun, Sebastian, Norbert Kordas, Alexander Utz, Holger Kappert, and Rainer Kokozinski. 2019. “Fully Integrated Sensor Electronics for Inductive Proximity Switches Operating up to 250 °C.” IMAPSource Proceedings 2019 (HiTen): 112–16. https://doi.org/10.4071/2380-4491.2019.HiTen.000112.
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