Vol. 2015, Issue DPC, 2015January 01, 2015 EDT
Reliability of Cu Wirebonded ICs for Automotive Applications
Reliability of Cu Wirebonded ICs for Automotive Applications
Jim McLeish, Greg Caswell, Randy Schueller,
McLeish, Jim, Greg Caswell, and Randy Schueller. 2015. “Reliability of Cu Wirebonded ICs for Automotive Applications.” IMAPSource Proceedings 2015 (DPC): 1721–52. https://doi.org/10.4071/Poster_DfR1.