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ISSN 2380-4505
High Temperature Conference Papers
Vol. 2016, Issue HiTEC, 2016May 01, 2016 EDT

A 225C Geothermal Logging Tool

Marshall Soares, Randy Normann, Bruce Ohme,
geothermalhigh temperatureHTHP loggingEEPROMRC10001. SOI
https://doi.org/10.4071/2016-HITEC-28

Articles in Vol. 2016, Issue HiTEC, 2016

Vol. 2016, Issue HiTEC, 2016
  • Developments for Copper-Graphite Composite Thermal Cores for PCBs for High-Reliability and High-Temperature RF Systems
    David L. SaumsRobert A. Hay
  • C0G and X7R Ceramic Capacitors for High Temperature Applications
    Abhijit GuravJim MageeReggie PhillipsScott Carson
  • Decapsulation of Plastic Encapsulated Microelectronics with Copper Wire Bonds
    Subramani ManoharanChandradip PatelPatrick McCluskey
  • Down-hole switching-mode power supply using a remote CA start up pulse
    Rito MijarezAngel GomezDavid PascacioIvan MartinezRicardo Guevara
  • Towards High Temperature Electronic Modules in which all Components would be attached using Silver Sintering
    Thomas GEOFFROYJean-Christophe RIOUYves BIENVENUCorinne PONSSylvain MEILLEEric BAILLY
  • Silicon-Carbide Power MOSFET Performance in High Efficiency Boost Power Processing Unit for Extreme Environments
    Stanley A. IkpeJean-Marie LauensteinGregory A. CarrDon HunterLawrence L. LudwigWilliam WoodLinda Y. Del CastilloMohammad M. MojarradiFred FitzpatrickYuan Chen
  • Method to Determine Maximum Allowable Sinterable Silver Interconnect Size
    A. A. WereszczakM. C. ModugnoS. B. WatersD. J. DeVotoP. P. Paret
  • A High Performance Power Module with >10kV capability to Characterize and Test In Situ SiC Devices at >200°C Ambient
    Xin ZhaoHaotao KeYifan JiangAdam MorganYang XuDouglas C. Hopkins
  • Aerospace Performances of IPDiA −250°C up to 250°C Grade Silicon Capacitors
    Laurent LengignonSebastien Leruez
  • HOT-300 – A Multidisciplinary Technology Approach Targeting Microelectronic Systems at 300 °C Operating Temperature
    Holger VogtFrank AltmannSebastian BraunYusuf CelikLothar DietrichDorothee DietzMarius van DijkStefan DreinerRalf DoeringFelix GablerAndreas GoehlichMatthias HutterMartin IhleHolger KappertNorbert KordasRainer KokozinskiFalk NaumannTorsten NowakHermann OppermannUwe PartschMatthias PetzoldFrank RoscherSven RzepkaRalph SchubertConstanze WeberMaik WiemerOlaf WittlerSteffen Ziesche
  • The Design, Simulation, and Performance Characteristics of High Temperature Brushed and Brushless DC Motors, and Their Electronic Controllers
    Harold L. Snyder
  • High Reliability Electronics for Demanding Aircraft Applications – An Overview
    Roger Brewer
  • Silver Sintering Paste Rendering Low Porosity Joint for High Power Die Attach Application
    Sihai ChenChristine LaBarberaNing-Cheng Lee
  • Component Attachment with Pressureless Sintering for 300°C Applications
    Fang YuJinzi CuiZhangming ZhouR. Wayne JohnsonMichael C. Hamilton
  • Tantalum Capacitor Technology Options for High Temperature and Harsh Environment Applications
    Chris Reynolds
  • Low Power Silicon Carbide RS-485 Transceiver
    M. R. BenavidesA. N. CastilloA. RahmanM. BarlowD. AbreuC. RowlettH. A. MantoothA. M. FrancisJ. A. Holmes
  • High temperature / radiation hardened capable ARM® Cortex®-M0 microcontrollers
    R. BannatyneD. GiffordK. KleinC. Merritt
  • A 225C Geothermal Logging Tool
    Marshall SoaresRandy NormannBruce Ohme
  • Effect of isothermal aging at 250 °C on shear strength of joints using Au nanoporous bonding for die attach
    H. NishikawaK. MatsunagaM-S. KimM. SaitoJ. Mizuno
  • Processing and Characterization of Thousand-Hour 500 °C Durable 4H-SiC JFET Integrated Circuits
    David J. SpryPhilip G. NeudeckLiang-Yu ChenDorothy LukcoCarl W. ChangGlenn M. BeheimMichael J. KrasowskiNorman F. Prokop
  • A 200C capable embedded EEPROM
    Dean AllumTomas DrajsajtlRadomir PlachejdaStanislav SeleznevRichard Wheelus
  • High Temperature Potting Materials for Wire Bond Encapsulation
    David ShaddockLiang Yin
  • High-Temperature Operation of Silicon Carbide CMOS Circuits for Venus Surface Application
    A. Matthew FrancisJim HolmesNick ChiolinoMatthew BarlowAffan AbbasiH. Alan Mantooth
  • Development of BiAgX® HT Solder Paste for 200°C Application
    Hongwen ZhangJonathan MinterNing-Cheng Lee
  • First-Order SPICE Modeling of Extreme-Temperature 4H-SiC JFET Integrated Circuits
    Philip G. NeudeckDavid J. SpryLiang-Yu Chen
  • Development of a High Temperature Interconnect Solution as an Alternative to High Lead or Gold Content Solders
    Martin WickhamKate ClaytonAna RobadorChris HuntRobin PittsonLaura StattonTina BrownFiona LambertTracy Wotherspoon
  • High-Temperature Self-Supplied Isolated Driver Module for GaN Power Transistors
    Xavier BaieVincent DessardRené EscoffierFabien LaplaceGonzalo Picun
  • Encapsulation Method for Small Wireless Measurement Systems in High Temperature Environments
    J. JohanssonJ. Borg
  • Flip-chip Bonded SiC Power Devices on a Low Temperature Co-fired Ceramic (LTCC) Substrate for Next Generation Power Modules
    Sayan SealMichael D. GloverH. Alan Mantooth
  • Towards Integrated Sensors for Environments with Temperatures up to 600 °C
    Ayden MaralaniLevent BekerAlbert P. Pisano
  • Nanocomposite Film Dielectrics for High Temperature Power Conditioning Capacitors
    Kirk SlenesDale PerryLew Bragg
  • High Precision Analog Multiplexers Enable Multi-Channel Data Acquisition in High Temperature Environments
    Jeff WatsonStephen KavanaghStephen Nugent
  • Degradation Analysis of TO-247 Package SiC-MOSFETs Subjected to High Temperature Storage and Heavy Thermal Cycle Test
    Sawa ArakiTatsuhiro SuzukiMari YamashitaSatoshi TanimotoToshiaki OnoHisashi YakumaruHiroki Sawada
  • AVX High Temperature Products for Surface Mount and SMPS Applications
    Dave DuprePatrick German
  • Internal Structure Refinement of Porous Sintered Silver via Electromigration
    Ali MansourianSeyed Amir PaknejadQiannan WenKhalid KhtatbaAnatoly V. ZayatsSamjid H. Mannan
  • Design of High Temperature Combline Band-pass Filters for Downhole Communications
    Mohammed EhteshamuddinJebreel M. SalemDong Sam Ha
  • Increased High-Temperature IC Packaging Reliability Using Die Extraction and Additive Manufacturing Assembly
    Erick M. Spory
  • A CMOS SiC Linear Voltage Regulator for High Temperature Applications
    R.C. MurphreeS. AhmedM. BarlowA. RahmanH.A. MantoothA. M. Francis
  • Toward Interpreting Failure in Sintered-Silver Interconnection Systems†
    M. C. ModugnoA. A. WereszczakS. B. Waters
  • Improving Efficiency in Downhole Power Converters using GaN Technology
    Gary Hanington
  • Design and Testing of a High Temperature Inverter
    Shashank KrishnamurthyStephen SavulakYang Wang
  • Electrical Performance of a High Temperature 32-I/O HTCC Alumina Package
    Liang-Yu ChenPhilip G. NeudeckDavid J. SpryGlenn M. BeheimGary W. Hunter
  • Co-fired Platinum High Temperature Sensor Element
    Tsutomu SugawaraHiroshi MatsumotoHiroki ItoShingo SatoMasanari Kokubu
  • System On Chip (SOC) ASIC chipset for Smart Actuators in Distributed Propulsion Systems
    Bhal TulpuleAlireza R. Behbahani
  • Metallic TIM Testing and Selection for Harsh Environment Applications for GaN RF Semiconductors
    Tim JensenDavid L. Saums
  • High Temperature GaN Gate Driver in SOI CMOS Technology
    Holger KappertSebastian BraunNorbert KordasStefan DreinerRainer Kokozinski
  • A High Temperature Passive GaN-HEMT Mixer for Downhole Communications
    Jebreel M. SalemDong Sam Ha
IMAPSource Conference Papers
Soares, Marshall, Randy Normann, and Bruce Ohme. 2016. “A 225C Geothermal Logging Tool.” IMAPSource Proceedings 2016 (HiTEC): 28–34. https://doi.org/10.4071/2016-HITEC-28.
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