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ISSN 2380-4505
High Temperature Conference Papers
Vol. 2016, Issue HiTEC, 2016May 01, 2016 EDT

Silicon-Carbide Power MOSFET Performance in High Efficiency Boost Power Processing Unit for Extreme Environments

Stanley A. Ikpe, Jean-Marie Lauenstein, Gregory A. Carr, Don Hunter, Lawrence L. Ludwig, William Wood, Linda Y. Del Castillo, Mohammad M. Mojarradi, Fred Fitzpatrick, Yuan Chen,
Silicon Carbide (SiC)MOSFETsHigh Temperature Gate BiasHigh Temperature Reverse BiasExtreme EnvironmentPower Processing Unit
https://doi.org/10.4071/2016-HITEC-184
IMAPSource Conference Papers
Ikpe, Stanley A., Jean-Marie Lauenstein, Gregory A. Carr, Don Hunter, Lawrence L. Ludwig, William Wood, Linda Y. Del Castillo, Mohammad M. Mojarradi, Fred Fitzpatrick, and Yuan Chen. 2016. “Silicon-Carbide Power MOSFET Performance in High Efficiency Boost Power Processing Unit for Extreme Environments.” IMAPSource Proceedings 2016 (HiTEC): 184–89. https:/​/​doi.org/​10.4071/​2016-HITEC-184.

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