ISSN 2380-4505
Vol. 2022, Issue HiTEN, 2022November 07, 2023 EDT
Extended Lifetime Testing of SiC CMOS Electronics at 500°C
Extended Lifetime Testing of SiC CMOS Electronics at 500°C
Andarawis, Emad, Cheng-Po (Paul) Chen, Jeremy Popp, Liang Yin, and David Shaddock. 2023. “Extended Lifetime Testing of SiC CMOS Electronics at 500°C.” IMAPSource Proceedings 2022 (HiTEN): 54–58. https://doi.org/10.4071/001c.89941.