Vol. 2023, Issue HiTEC, CICMT, Power, 2023October 17, 2023 EDT
Recent Progress in Extreme Environment Durable SiC JFET-R Integrated Circuit Technology
Recent Progress in Extreme Environment Durable SiC JFET-R Integrated Circuit Technology
Neudeck, Philip G., David J. Spry, Michael J. Krasowski, Carl W. Chang, José M. Gonzalez, Srihari Rajgopal, Norman F. Prokop, et al. 2023. “Recent Progress in Extreme Environment Durable SiC JFET-R Integrated Circuit Technology.” IMAPSource Proceedings 2023 (HiTEC, CICMT, Power): 43–48. https://doi.org/10.4071/001c.89108.