Vol. 2023, Issue HiTEC, CICMT, Power, 2023October 17, 2023 EDT
Gate Driver Design in 180 nm SOI CMOS Process for Heterogeneous Integration Inside SiC Power Module
Gate Driver Design in 180 nm SOI CMOS Process for Heterogeneous Integration Inside SiC Power Module
Faruque, Asif, Ayesha Hassan, Riya Paul, and H. Alan Mantooth. 2023. “Gate Driver Design in 180 Nm SOI CMOS Process for Heterogeneous Integration Inside SiC Power Module.” IMAPSource Proceedings 2023 (HiTEC, CICMT, Power): 37–42. https://doi.org/10.4071/001c.89107.