Prevention of Cu Electrolytic Migration Defects on RDL by a Cu-Selective Passivation to Enhance Reliability

Ashish Salunke; John Alptekin; Kaushik Akula; Subiksha Jayakumar; Shaurya Kumar; Oliver Chyan

doi:10.4071/001c.74769

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Salunke, Ashish, John Alptekin, Kaushik Akula, Subiksha Jayakumar, Shaurya Kumar, and Oliver Chyan. 2023. “Prevention of Cu Electrolytic Migration Defects on RDL by a Cu-Selective Passivation to Enhance Reliability.” IMAPSource Proceedings 2022 (1): 000264–72. https://doi.org/10.4071/001c.74769.

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