Vol. 2022, Issue IMAPS Symposium, 2022May 01, 2023 EDT
Novel Electroformed Ni-Au Alloy for High Temperature Semiconductor Test Structures
Novel Electroformed Ni-Au Alloy for High Temperature Semiconductor Test Structures
Hilty, Robert D., and Evgeniya Freydina. 2023. “Novel Electroformed Ni-Au Alloy for High Temperature Semiconductor Test Structures.” IMAPSource Proceedings 2022 (IMAPS Symposium): 000085–000088. https://doi.org/10.4071/001c.74615.