Novel Electroformed Ni-Au Alloy for High Temperature Semiconductor Test Structures

Robert D. Hilty; Evgeniya Freydina

doi:10.4071/001c.74615

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Hilty, Robert D., and Evgeniya Freydina. 2023. “Novel Electroformed Ni-Au Alloy for High Temperature Semiconductor Test Structures.” IMAPSource Proceedings 2022 (1): 000085–000088. https://doi.org/10.4071/001c.74615.

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