Vol. 2021, Issue HiTEC, CICMT, Power, 2021April 01, 2021 EDT
Alternative Setup for Long-Duration Low-Duty-Cycle 600°C Ambient Testing of SiC Integrated Circuits
Alternative Setup for Long-Duration Low-Duty-Cycle 600°C Ambient Testing of SiC Integrated Circuits
Alain Izadnegahdar, Stephanie L. Booth, David J. Spry, Philip G. Neudeck,
Izadnegahdar, Alain, Stephanie L. Booth, David J. Spry, and Philip G. Neudeck. 2021. “Alternative Setup for Long-Duration Low-Duty-Cycle 600°C Ambient Testing of SiC Integrated Circuits.” IMAPSource Proceedings 2021 (HiTEC, CICMT, Power): 76–82. https://doi.org/10.4071/2380-4491.2021.HiTEC.000076.