Vol. 2021, Issue HiTEC, CICMT, Power, 2021April 01, 2021 EDT
GE SiC Semiconductor Device Operation at Extreme Temperatures
GE SiC Semiconductor Device Operation at Extreme Temperatures
David Esler,
Esler, David. 2021. “GE SiC Semiconductor Device Operation at Extreme Temperatures.” IMAPSource Proceedings 2021 (HiTEC, CICMT, Power): 41–47. https://doi.org/10.4071/2380-4491.2021.HiTEC.000041.