Enhancement Mode GaN-FETs in Extreme Temperature Conditions, Part II: Dynamic Parasitic Parameters

Martijn S. Duraij; Yudi Xiao; Gabriel Zsurzsan; Zhe Zang

doi:10.4071/2380-4491.2021.HiTEC.000053

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Duraij, Martijn S., Yudi Xiao, Gabriel Zsurzsan, and Zhe Zang. 2021. “Enhancement Mode GaN-FETs in Extreme Temperature Conditions, Part II: Dynamic Parasitic Parameters.” IMAPSource Proceedings 2021 (HiTEC, CICMT, Power): 53–57. https://doi.org/10.4071/2380-4491.2021.HiTEC.000053.

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