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Vol. 2021, Issue IMAPS Symposium, 2021October 01, 2021 EDT

Highly accelerated lifetime testing in power electronics

Bernhard Czerny, Golta Khatibi,
IGBT power module reliabilitypower cycling vs shear test qualificationthermo-mechanical fatiguewire bond interconnects
https://doi.org/10.4071/1085-8024-2021.1.000390
IMAPSource Conference Papers
Czerny, Bernhard, and Golta Khatibi. 2021. “Highly Accelerated Lifetime Testing in Power Electronics.” IMAPSource Proceedings 2021 (IMAPS Symposium): 390–96. https:/​/​doi.org/​10.4071/​1085-8024-2021.1.000390.
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