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Vol. 2021, Issue 1, 2021October 01, 2021 EDT

Highly accelerated lifetime testing in power electronics

Bernhard Czerny, Golta Khatibi,
IGBT power module reliability power cycling vs shear test qualification thermo-mechanical fatigue wire bond interconnects
• https://doi.org/10.4071/1085-8024-2021.1.000390
IMAPSource Conference Papers
Czerny, Bernhard, and Golta Khatibi. 2021. “Highly Accelerated Lifetime Testing in Power Electronics.” IMAPSource Proceedings 2021 (1): 390–96. https://doi.org/10.4071/1085-8024-2021.1.000390.
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