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General
Vol. 2021, Issue 1, 2021
October 01, 2021 EDT
Highly accelerated lifetime testing in power electronics
Bernhard Czerny
,
Golta Khatibi
,
IGBT power module reliability
power cycling vs shear test qualification
thermo-mechanical fatigue
wire bond interconnects
•
https://doi.org/10.4071/1085-8024-2021.1.000390
IMAPSource Conference Papers
Czerny, Bernhard, and Golta Khatibi. 2021. “Highly Accelerated Lifetime Testing in Power Electronics.”
IMAPSource Proceedings
2021 (1): 390–96.
https://doi.org/10.4071/1085-8024-2021.1.000390
.
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