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General
Vol. 2021, Issue 1, 2021
October 01, 2021 EDT
Atomistic modeling to predict and improve the strength of doped Sn-Cu solder interfaces
Michael Woodcox
,
Manuel Smeu
,
AIMD
DFT
Interfaces
Solder
Strain
Stress
•
https://doi.org/10.4071/imaps.1803272
IMAPSource Conference Papers
Woodcox, Michael, and Manuel Smeu. 2021. “Atomistic Modeling to Predict and Improve the Strength of Doped Sn-Cu Solder Interfaces.”
IMAPSource Proceedings
2021 (1): 321–27.
https://doi.org/10.4071/imaps.1803272
.
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