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Vol. 2021, Issue IMAPS Symposium, 2021October 01, 2021 EDT

Impact of Bonding Sequence on Contact Resistance in Hybrid Bonding of Via-middle TSV Wafer

Naoya Watanabe, Hiroshi Yamamoto, Takahiko Mitsui, Eiichi Yamamoto,
via-middlethrough-silicon via (TSV)direct Si/Cu grindinghybrid bonding
https://doi.org/10.4071/1085-8024-2021.1.000244
IMAPSource Conference Papers
Watanabe, Naoya, Hiroshi Yamamoto, Takahiko Mitsui, and Eiichi Yamamoto. 2021. “Impact of Bonding Sequence on Contact Resistance in Hybrid Bonding of Via-Middle TSV Wafer.” IMAPSource Proceedings 2021 (IMAPS Symposium): 244–48. https:/​/​doi.org/​10.4071/​1085-8024-2021.1.000244.
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