Vol. 2021, Issue 1, 2021October 01, 2021 EDT
Burn-in-Testing (BIT) Challenge: to BIT or not to BIT?
Burn-in-Testing (BIT) Challenge: to BIT or not to BIT?
Boltzmann-Arrhenius-Zhurkov (BAZ) equation Burn-in testing (BIT) Bathtub curve (BTC) Electronics and photonics (E&P) Failure oriented accelerated testing (FOAT) Highly accelerated life testing (HALT) Infant mortality portion of the BTC (IMP) Mean time to failure (MTTF) Probabilistic design for reliability (PDfR) Probabilistic predictive modeling (PPM) RFR=Random failure rate (RFR) ”Statistical” (nonrandom) failure rate (SFR) Time-to-failure (TTF)
Suhir, E. 2021. “Burn-in-Testing (BIT) Challenge: To BIT or Not to BIT?” IMAPSource Proceedings 2021 (1): 31–38. https://doi.org/10.4071/1085-8024-2021.1.000031.
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