Loading [Contrib]/a11y/accessibility-menu.js
IMAPSource Conference Papers
Menu
Articles
Ceramics Conference Papers
Device Packaging Conference Presentations
General
High Temperature Conference Papers
IMAPS Chapter Conferences
Symposium Proceedings
All
For Authors
Editorial Board
About
Issues
Journal Micro & Elect Pkg
search
Sorry, something went wrong. Please try your search again.
×
Articles
Blog posts
RSS Feed
Enter the URL below into your favorite RSS reader.
https://imapsource.org/feed
×
General
Vol. 2021, Issue 1, 2021
October 01, 2021 EDT
Burn-in-Testing (BIT) Challenge: to BIT or not to BIT?
E. Suhir
,
Boltzmann-Arrhenius-Zhurkov (BAZ) equation
Burn-in testing (BIT)
Bathtub curve (BTC)
Electronics and photonics (E&P)
Failure oriented accelerated testing (FOAT)
Highly accelerated life testing (HALT)
Infant mortality portion of the BTC (IMP)
Mean time to failure (MTTF)
Probabilistic design for reliability (PDfR)
Probabilistic predictive modeling (PPM)
RFR=Random failure rate (RFR)
”Statistical” (nonrandom) failure rate (SFR)
Time-to-failure (TTF)
•
https://doi.org/10.4071/1085-8024-2021.1.000031
IMAPSource Conference Papers
Suhir, E. 2021. “Burn-in-Testing (BIT) Challenge: To BIT or Not to BIT?”
IMAPSource Proceedings
2021 (1): 31–38.
https://doi.org/10.4071/1085-8024-2021.1.000031
.
Save article as...
▾
PDF
XML
Citation (BibTeX)
View more stats