Vol. 2021, Issue IMAPS Symposium, 2021October 01, 2021 EDT
Burn-in-Testing (BIT) Challenge: to BIT or not to BIT?
Burn-in-Testing (BIT) Challenge: to BIT or not to BIT?
E. Suhir,
Boltzmann-Arrhenius-Zhurkov (BAZ) equationBurn-in testing (BIT)Bathtub curve (BTC)Electronics and photonics (E&P)Failure oriented accelerated testing (FOAT)Highly accelerated life testing (HALT)Infant mortality portion of the BTC (IMP)Mean time to failure (MTTF)Probabilistic design for reliability (PDfR)Probabilistic predictive modeling (PPM)RFR=Random failure rate (RFR)”Statistical” (nonrandom) failure rate (SFR)Time-to-failure (TTF)
Suhir, E. 2021. “Burn-in-Testing (BIT) Challenge: To BIT or Not to BIT?” IMAPSource Proceedings 2021 (IMAPS Symposium): 31–38. https://doi.org/10.4071/1085-8024-2021.1.000031.