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High Temperature Conference Papers
Vol. 2016, Issue HiTEC, 2016May 01, 2016 EDT

High Temperature GaN Gate Driver in SOI CMOS Technology

Holger Kappert, Sebastian Braun, Norbert Kordas, Stefan Dreiner, Rainer Kokozinski,
High TemperatureGaNGate driverSOI CMOS
https://doi.org/10.4071/2016-HITEC-112
IMAPSource Conference Papers
Kappert, Holger, Sebastian Braun, Norbert Kordas, Stefan Dreiner, and Rainer Kokozinski. 2016. “High Temperature GaN Gate Driver in SOI CMOS Technology.” IMAPSource Proceedings 2016 (HiTEC): 112–15. https:/​/​doi.org/​10.4071/​2016-HITEC-112.
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