This website uses cookies

We use cookies to enhance your experience and support COUNTER Metrics for transparent reporting of readership statistics. Cookie data is not sold to third parties or used for marketing purposes.

Skip to main content
null
IMAPSource Conference Papers
  • Menu
  • Articles
    • Ceramics Conference Papers
    • Device Packaging Conference Presentations
    • EMPC Conference Proceedings (IMAPS Europe)
    • General
    • High Temperature Conference Papers
    • IMAPS Chapter Conferences
    • Symposium Proceedings
    • All
  • For Authors
  • Editorial Board
  • About
  • Issues
  • Journal Micro & Elect Pkg
  • search
  • LinkedIn (opens in a new tab)
  • RSS feed (opens a modal with a link to feed)

RSS Feed

Enter the URL below into your favorite RSS reader.

http://localhost:49382/feed
ISSN 2380-4505
High Temperature Conference Papers
Vol. 2016, Issue HiTEC, 2016May 01, 2016 EDT

High Temperature GaN Gate Driver in SOI CMOS Technology

Holger Kappert, Sebastian Braun, Norbert Kordas, Stefan Dreiner, Rainer Kokozinski,
High TemperatureGaNGate driverSOI CMOS
https://doi.org/10.4071/2016-HITEC-112
IMAPSource Conference Papers
Kappert, Holger, Sebastian Braun, Norbert Kordas, Stefan Dreiner, and Rainer Kokozinski. 2016. “High Temperature GaN Gate Driver in SOI CMOS Technology.” IMAPSource Proceedings 2016 (HiTEC): 112–15. https:/​/​doi.org/​10.4071/​2016-HITEC-112.

View more stats

Powered by Scholastica, the modern academic journal management system