Vol. 2016, Issue HiTEC, 2016May 01, 2016 EDT
Metallic TIM Testing and Selection for Harsh Environment Applications for GaN RF Semiconductors
Metallic TIM Testing and Selection for Harsh Environment Applications for GaN RF Semiconductors
Tim Jensen, David L. Saums,
Jensen, Tim, and David L. Saums. 2016. “Metallic TIM Testing and Selection for Harsh Environment Applications for GaN RF Semiconductors.” IMAPSource Proceedings 2016 (HiTEC): 79–86. https://doi.org/10.4071/2016-HITEC-79.