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ISSN 2380-4505
Device Packaging Conference Presentations
Vol. 2016, Issue DPC, 2016January 01, 2016 EDT

Characterization of Clean after Photoresist Removal from Wafers with Copper Pillars with Lead-Free Solder Caps

Kimberly Pollard, Richie Peters, Michael Phenis, Don Pfettscher,
Cu PillarStrippingInspection
https://doi.org/10.4071/2016DPC-TA24
IMAPSource Conference Papers
Pollard, Kimberly, Richie Peters, Michael Phenis, and Don Pfettscher. 2016. “Characterization of Clean after Photoresist Removal from Wafers with Copper Pillars with Lead-Free Solder Caps.” IMAPSource Proceedings 2016 (DPC): 421–36. https:/​/​doi.org/​10.4071/​2016DPC-TA24.

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