Vol. 2010, Issue HITEC, 2010January 01, 2010 EDT
Assessment of Au-Ge Die Attachment for an Extended Junction Temperature Range in Power Applications
Assessment of Au-Ge Die Attachment for an Extended Junction Temperature Range in Power Applications
Tanimoto, Satoshi, Kohei Matsui, Yoshinori Murakami, Hiroshi Yamaguchi, and Hajime Okumura. 2010. “Assessment of Au-Ge Die Attachment for an Extended Junction Temperature Range in Power Applications.” IMAPSource Proceedings 2010 (HITEC): 32–39. https://doi.org/10.4071/HITEC-STanimoto-TA16.
Powered by Scholastica, the modern academic journal management system