Vol. 2010, Issue HITEC, 2010January 01, 2010 EDT
Reliability Assessment of Passives for 300C using HALT
Reliability Assessment of Passives for 300C using HALT
David Shaddock, Vinayak Tilak, Tan Zhang, Rui Zhang, R. Wayne Johnson,
Shaddock, David, Vinayak Tilak, Tan Zhang, Rui Zhang, and R. Wayne Johnson. 2010. “Reliability Assessment of Passives for 300C Using HALT.” IMAPSource Proceedings 2010 (HITEC): 199–206. https://doi.org/10.4071/HITEC-DShaddock-WA15.