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High Temperature Conference Papers
Vol. 2010, Issue HITEC, 2010
January 01, 2010 EDT
Reliability Assessment of Passives for 300C using HALT
David Shaddock
,
Vinayak Tilak
,
Tan Zhang
,
Rui Zhang
,
R. Wayne Johnson
,
High Temperature
Capacitor
Resistors
•
https://doi.org/10.4071/HITEC-DShaddock-WA15
IMAPSource Conference Papers
Shaddock, David, Vinayak Tilak, Tan Zhang, Rui Zhang, and R. Wayne Johnson. 2010. “Reliability Assessment of Passives for 300C Using HALT.”
IMAPSource Proceedings
2010 (HITEC): 199–206.
https://doi.org/10.4071/HITEC-DShaddock-WA15
.
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