Vol. 2010, Issue HITEC, 2010January 01, 2010 EDT
Performance and Reliability of MEMS Gyroscopes and Packaging at High Temperatures
Performance and Reliability of MEMS Gyroscopes and Packaging at High Temperatures
McCluskey, Patrick, Chandradip Patel, and David Lemus. 2010. “Performance and Reliability of MEMS Gyroscopes and Packaging at High Temperatures.” IMAPSource Proceedings 2010 (HITEC): 359–66. https://doi.org/10.4071/HITEC-PMcCluskey-THA22.
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