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High Temperature Conference Papers
Vol. 2010, Issue HITEC, 2010
January 01, 2010 EDT
High Temperature CMOS Reliability and Drift
Shane Rose
,
CMOS Reliability
ASIC
Voltage Regulator
High Temperature Electronics
•
https://doi.org/10.4071/HITEC-SRose-TA21
IMAPSource Conference Papers
Rose, Shane. 2010. “High Temperature CMOS Reliability and Drift.”
IMAPSource Proceedings
2010 (HITEC): 40–46.
https://doi.org/10.4071/HITEC-SRose-TA21
.
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