Vol. 2010, Issue HITEC, 2010January 01, 2010 EDT
Compact modeling of the high temperature effect on the single event transient current generated by heavy ions in SOI 6T-SRAM
Compact modeling of the high temperature effect on the single event transient current generated by heavy ions in SOI 6T-SRAM
E. Boufouss, J. Alvarado, D. Flandre,
Boufouss, E., J. Alvarado, and D. Flandre. 2010. “Compact Modeling of the High Temperature Effect on the Single Event Transient Current Generated by Heavy Ions in SOI 6T-SRAM.” IMAPSource Proceedings 2010 (HITEC): 77–82. https://doi.org/10.4071/HITEC-EBoufouss-TA25.