285°C Resistor Drift and Failure Analysis

Mark Hahn; Ron Smith; Milton Watts

doi:10.4071/HITEC-MHahn-WP13

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Hahn, Mark, Ron Smith, and Milton Watts. 2010. “285°C Resistor Drift and Failure Analysis.” IMAPSource Proceedings 2010 (HITEC): 259–66. https://doi.org/10.4071/HITEC-MHahn-WP13.

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