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Device Packaging Conference Presentations
Vol. 2010, Issue DPC, 2010January 01, 2010 EDT

Underfill Induced Tensile Strain Ratcheting and its Effect on Flip Chip Solder Bump Fatigue

Craig D. Hillman, Randy Schueller, Greg Caswell,
underfill low Tg reliability effects
• https://doi.org/10.4071/2010DPC-ta34
IMAPSource Conference Papers
Hillman, Craig D., Randy Schueller, and Greg Caswell. 2010. “Underfill Induced Tensile Strain Ratcheting and Its Effect on Flip Chip Solder Bump Fatigue.” IMAPSource Proceedings 2010 (DPC): 737–58. https://doi.org/10.4071/2010DPC-ta34.
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