ISSN 2380-4505
Vol. 2014, Issue HITEC, 2014January 01, 2014 EDT
Highly Integrated and Isolated Universal Half-Bridge Power Gate Driver and Associated Flyback Power Supply for High Temperature and High Reliability Applications
Highly Integrated and Isolated Universal Half-Bridge Power Gate Driver and Associated Flyback Power Supply for High Temperature and High Reliability Applications
David Gras, Christophe Pautrel, Amir Fanaei, Gregory Thepaut, Maxime Chabert, Fabien Laplace, Gonzalo Picun,
Gras, David, Christophe Pautrel, Amir Fanaei, Gregory Thepaut, Maxime Chabert, Fabien Laplace, and Gonzalo Picun. 2014. “Highly Integrated and Isolated Universal Half-Bridge Power Gate Driver and Associated Flyback Power Supply for High Temperature and High Reliability Applications.” IMAPSource Proceedings 2014 (HITEC): 206–13. https://doi.org/10.4071/HITEC-WP12.