Vol. 2014, Issue HITEC, 2014January 01, 2014 EDT
The Effects of Repeated Refresh Cycles on the Oxide Integrity of EEPROM Memories at High Temperature
The Effects of Repeated Refresh Cycles on the Oxide Integrity of EEPROM Memories at High Temperature
Lynn Reed, Vema Reddy,
Reed, Lynn, and Vema Reddy. 2014. “The Effects of Repeated Refresh Cycles on the Oxide Integrity of EEPROM Memories at High Temperature.” IMAPSource Proceedings 2014 (HITEC): 142–45. https://doi.org/10.4071/HITEC-WA12.