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Device Packaging Conference Presentations
Vol. 2014, Issue DPC, 2014
January 01, 2014 EDT
Fatigue testing of bulk materials using a microsystems based approach
Li-Anne Liew
,
David T. Read
,
Nicholas Barbosa
,
fatigue
MEMS
reliability
•
https://doi.org/10.4071/2014DPC-ta34
IMAPSource Conference Papers
Liew, Li-Anne, David T. Read, and Nicholas Barbosa. 2014. “Fatigue Testing of Bulk Materials Using a Microsystems Based Approach.”
IMAPSource Proceedings
2014 (DPC): 632–64.
https://doi.org/10.4071/2014DPC-ta34
.
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