Vol. 2019, Issue HiTen, 2019July 01, 2019 EDT
Modular Desktop Platform for High-Temperature Characterization and Test up to 300 °C
Modular Desktop Platform for High-Temperature Characterization and Test up to 300 °C
Tom Reinhold, Björn Bieske, Georg Gläser, Michael Meister,
Reinhold, Tom, Björn Bieske, Georg Gläser, and Michael Meister. 2019. “Modular Desktop Platform for High-Temperature Characterization and Test up to 300 °C.” IMAPSource Proceedings 2019 (HiTen): 117–21. https://doi.org/10.4071/2380-4491.2019.HiTen.000117.