Vol. 2019, Issue DPC, 2019January 01, 2019 EDT
Thermal Characterization of Quasi-Vertical GaAs Schottky Diodes Integrated on Silicon Using Thermoreflectance and Electrical Transient Measurements
Thermal Characterization of Quasi-Vertical GaAs Schottky Diodes Integrated on Silicon Using Thermoreflectance and Electrical Transient Measurements
Robert M. Weikle, S. Nadri, C.M. Moore, N. D. Sauber, L. Xie, M. E. Cyberey, N. Scott Barker, A. W. Lichtenberger, M Zebarjadi,
Weikle, Robert M., S. Nadri, C.M. Moore, N. D. Sauber, L. Xie, M. E. Cyberey, N. Scott Barker, A. W. Lichtenberger, and M Zebarjadi. 2019. “Thermal Characterization of Quasi-Vertical GaAs Schottky Diodes Integrated on Silicon Using Thermoreflectance and Electrical Transient Measurements.” IMAPSource Proceedings 2019 (DPC): 1293–1310. https://doi.org/10.4071/2380-4491-2019-DPC-Presentation_THA3_009.