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ISSN 2380-4505
Ceramics Conference Papers
Vol. 2013, Issue CICMT, 2013September 01, 2013 EDT

Evaluation of TFR-Characteristics in aWide Temperature Range

Uwe Partsch, Christian Lenz, Marco Wenzel, Markus Eberstein,
thick film resistorshigh temperatureGauge factor
https://doi.org/10.4071/CICMT-2013-THA31
IMAPSource Conference Papers
Partsch, Uwe, Christian Lenz, Marco Wenzel, and Markus Eberstein. 2013. “Evaluation of TFR-Characteristics in aWide Temperature Range.” IMAPSource Proceedings 2013 (CICMT): 247–51. https:/​/​doi.org/​10.4071/​CICMT-2013-THA31.

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