Vol. 2013, Issue CICMT, 2013September 01, 2013 EDT
Wide Band Measurement of Dielectric Properties of Electronic Assembly Materials Inside a LTCC Fluidic Structure
Wide Band Measurement of Dielectric Properties of Electronic Assembly Materials Inside a LTCC Fluidic Structure
Jens Müller,
Müller, Jens. 2013. “Wide Band Measurement of Dielectric Properties of Electronic Assembly Materials Inside a LTCC Fluidic Structure.” IMAPSource Proceedings 2013 (CICMT): 41–46. https://doi.org/10.4071/CICMT-TP22.