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Device Packaging Conference Presentations
Vol. 2013, Issue DPC, 2013January 01, 2013 EDT

A Process Dependent Warpage and Stress Model for 3D Packages Considering Incoming Die/Substrate Warpage and Assembly Process Impacts

Wei Lin, Ahmer Syed, KiWook Lee, Karthikeyan Dhandapani,
warpageprocess effectincoming die/substrate warpage
https://doi.org/10.4071/2013DPC-wp31
IMAPSource Conference Papers
Lin, Wei, Ahmer Syed, KiWook Lee, and Karthikeyan Dhandapani. 2013. “A Process Dependent Warpage and Stress Model for 3D Packages Considering Incoming Die/Substrate Warpage and Assembly Process Impacts.” IMAPSource Proceedings 2013 (DPC): 1603–21. https:/​/​doi.org/​10.4071/​2013DPC-wp31.
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