Vol. 2013, Issue DPC, 2013January 01, 2013 EDT
High Reliability Fine Pitch WLCSP for High Pin Count Applications
High Reliability Fine Pitch WLCSP for High Pin Count Applications
Lawhead, David, Ronnie Yazzie, Tony Curtis, Guy Burgess, and Ted Tessier. 2013. “High Reliability Fine Pitch WLCSP for High Pin Count Applications.” IMAPSource Proceedings 2013 (DPC): 1894–1907. https://doi.org/10.4071/2013DPC-tha21.
Powered by Scholastica, the modern academic journal management system