ISSN 2380-4505
Vol. 2013, Issue DPC, 2013January 01, 2013 EDT
Integration, Electrical Performance and Reliability Investigation of TSV
Integration, Electrical Performance and Reliability Investigation of TSV
Shih-Wei Lee, Yu-Chen Hu, Cheng-Hao Chiang, Kuo-Hua Chen, Chi-Tsung Chiu, Ching-Te Chuang, Wei Hwang, Jin-Chern Chiou, Ho-Ming Tong, Kuan-Neng Chen,
Lee, Shih-Wei, Yu-Chen Hu, Cheng-Hao Chiang, Kuo-Hua Chen, Chi-Tsung Chiu, Ching-Te Chuang, Wei Hwang, Jin-Chern Chiou, Ho-Ming Tong, and Kuan-Neng Chen. 2013. “Integration, Electrical Performance and Reliability Investigation of TSV.” IMAPSource Proceedings 2013 (DPC): 1817–45. https://doi.org/10.4071/2013DPC-tha12.