Integration, Electrical Performance and Reliability Investigation of TSV

Shih-Wei Lee; Yu-Chen Hu; Cheng-Hao Chiang; Kuo-Hua Chen; Chi-Tsung Chiu; Ching-Te Chuang; Wei Hwang; Jin-Chern Chiou; Ho-Ming Tong; Kuan-Neng Chen

doi:10.4071/2013DPC-tha12

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Lee, Shih-Wei, Yu-Chen Hu, Cheng-Hao Chiang, Kuo-Hua Chen, Chi-Tsung Chiu, Ching-Te Chuang, Wei Hwang, Jin-Chern Chiou, Ho-Ming Tong, and Kuan-Neng Chen. 2013. “Integration, Electrical Performance and Reliability Investigation of TSV.” IMAPSource Proceedings 2013 (DPC): 1817–45. https://doi.org/10.4071/2013DPC-tha12.

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